- Digital VLSI: test systems for 512 channels, clock frequency from 50 mHz to 400 MHz, period duration from 20 ns, pulse rise time of 5 ns at the voltage of 5V;
Tester for VLSI digital Tester for VLSI Facility for digital Mobile test system ТРО04390А
parameters J750, digital parameters ECB measurements for the influence of
Teradyne (the USA) ETS-868 rapid temperature change
Temptronic installed on the board
- digital-to-analog and analog-to-digital integral circuits: test systems for 128 channels, steepness of the rise increment 1.5 V/ns, differential and integral nonlinearity less than 0.00008% FSR, resolving capacity of voltage up to 5 mV, resolving capacity of current up to 100 nA, frequency up to 50 MHz with the accuracy of ±0,01%, influence of supply voltage/reference voltage change up to 120 dB, dynamic range up to 90 dB;
Stand for parametric monitoring of analog and digital
integral circuits and devices, DMT-119 and ETS-780 tester
- analog integral circuits: measuring current resolution up to 1 fA, measuring voltage resolution up to 1 nV;
Facility for analog ECB measurements Digital tester for integral circuit parametric control
“FORMULA 2K”
- communication and radio technical microwave integral circuits: frequency from 50 MHz to 20 GHz;
Measuring complexes for microwave parameters Measuring complex for microwave parameters
DMT-118, DMT-134
- semiconductor devices: voltage from 1 µV to 1100 V, in DC mode from 1 pA to 100 A, in pulse mode from 1 A to 10 A;
Parametric monitoring of semiconductors, diodes and stabilitrons Parametric monitoring of transistors
DMT-120 DMT-220, chamber Espec SU-261
- resistors, capacitors, chokes, transformers, resonators: frequency from 20 Hz to 3 GHz, resistance from 0.01 mOhm to 99.9999 MOhm, impedance from 3 mOhm to 500 MOhm, capacity from 0.01 fF to 9.9999 F, inductance from 0.01 nH to 99.9999 kH, Q-factor from 0.01 to 99999.9, conductivity from 300 µS to 300 S, frequency step control from 1 Hz up to GHz units, methods of GOST RV, MIL-STD;
High precision LCR meter DMT-138 LCR meter DMT-137 Workplace No. 1
capacitor electric parameters control
Workplace No. 2 Workplace resistor electric Coils, chokes, transformers
capacitor electric parameters control parameters control parameters control workplaces
Dark room with 2 70613 Dark room with 2 electric generators, 1
NS monochromators (Newport) and an optical sphere oscilloscope and component power system
Measurement system for functional and parametric testing
of low-current FT17 relay, LLC Sovtest ATE (Russia)
SU-001 control stand
Voltage tester GPT-815 teraohmmeter Е6-13а
capacitor electric parameters control parameters control parameters control workplaces
- Solid-state light sources, photodiodes and devices based on them;
Dark room with 2 70613 Dark room with 2 electric generators, 1
NS monochromators (Newport) and an optical sphere oscilloscope and component power system
- relay;
Measurement system for functional and parametric testing
of low-current FT17 relay, LLC Sovtest ATE (Russia)
- modules, circuit boards and network devices;
SU-001 control stand
- switching devices;
- mounting devices;
Voltage tester GPT-815 teraohmmeter Е6-13а
