International Scientific and Technical Conference ‘EEE CERTIFICATION-2016’ St. Petersburg, April 20-22, 2016.
We invite you to take part in the International scientific and technical conference “Methods of providing modern electronic equipment with reliable electronic component base” (’EEE Certification-2016’), which took place from 20 to 22 April 2016 in the congress-hall of the ParkInn (Pulkovskaya) hotel, Pobedy sq., 1-2, Saint Petersburg (entrance from Varshavskaya street).
Conference starts at 10.00.
Independent examination
JSC "RNII" Electronstandart "offers the following types of expertise:
• technical expertise of the correctness of the use of the electronic component base of domestic and foreign production, the compliance of the declared characteristics and the quality level of the ECB, as well as the analysis of the ECB failures of domestic and foreign production;
• determination of structural and technological reserves to the effects of linear acceleration;
• expertise to identify signs of counterfeit origin of the electronic component base of domestic and foreign production.
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• technical expertise of the correctness of the use of the electronic component base of domestic and foreign production, the compliance of the declared characteristics and the quality level of the ECB, as well as the analysis of the ECB failures of domestic and foreign production;
• determination of structural and technological reserves to the effects of linear acceleration;
• expertise to identify signs of counterfeit origin of the electronic component base of domestic and foreign production.
Award for competence and objectivity
According to order No.29 from March 10, 2016 by the Director of the Centrsl body of the ‘Voeny Registr’ Voluntary Certification System, the QMS CB of JSC RRI ‘Electronstandart’ was awarded ‘For competence and objectivity in 2015’ award.
New publication in "LETI news" journal
On February 8, 2016, the council of young scientists and specialists of JSC RRI ‘Electronstandart’ sent an article for publication in the ‘LETI News’ journal entitled “Measurement of thermal chip-to-case resistance of microcircuits and semiconductor devices with the use of thermal imager” by I. Martynov.
Contest Future engineers-2015
Results of the youth industrial forum “Future engineers-2015” attended by the members of the Council of young scientists and specialists
• Winning the “Best team of engineers” nomination;
• 1st place in the “Best scientific work” nomination.
• Winning the “Best team of engineers” nomination;
• 1st place in the “Best scientific work” nomination.
