JSC "RRI "Electronstandar" has supported the "Machine engineering day with ASCON  2016" held in Saint Petersburg on October 12, 2016.

Specialist of the production department, P.S. Kuvalkin and S.Y. Vovk,

attended the presentation and were fully engaged in discussion of the latest ASCON software capabilities:

1. The new version of the computer-aided design system KOMPAS-3D V17.

2. The new version of Lotsman:PLM - ready-to-use process and methodological solutions for design-engineering production preparation.

3. Preview of the new MDM-system for an enterprise engineering reference data management. 

4. Process CAD system VERTICAL.

The industry specialists shared positive results of the product introduction as well as possible solutions in terms of combining new and existing software complexes within one enterprise or cooperation.

18 of June 2016 the representative of the Council of young scientists and specialists Pavel S. Kuvalkin (Lead Engineer, JSC "RNII" Electrostandard "), participated in the 1st Scientific and Information Forum JSC <Svetlana-Elektronpribor>, organized by JSC <Svetlana-Elektronpribor > in a picturesque district of the Leningrad region, in a recreation center <Georgian-4>.

JSC RRI ‘Electronstandart’ has traditionally supported the Open Doors Week which took place in the framework of the corporate youth policy of JSC "Ruselectronics”. During this week, in April 2016 JSC RRI Electronstandart was visited by more than 180 students interested in the work of the enterprise. Students of five universities took part in the event: St. Petersburg Electrotechnical University ‘LETI’, Peter the Great St. Petersburg Polytechnic University, the Bonch-Bruevich St. Petersburg State University of Telecommunications, St. Petersburg State University and St. Petersburg State University of Economics. The event was organized and performed by the JSC RRI ‘Electronstandart’ Council of Young Scientists and Specialists approved and supported by the Institute administration.

On February 8, 2016, the council of young scientists and specialists of JSC RRI ‘Electronstandart’ sent an article for publication in the ‘LETI News’ journal entitled “Measurement of thermal chip-to-case resistance of microcircuits and semiconductor devices with the use of thermal imager” by I. Martynov.